Prairie Nanotechnology, commercial materials analysis and characterization

Research Support Services

Prairie Nanotechnology is currently performing research and development on a variety of samples for use as standards for materials characterization, both for our own use and also to help support other research groups.  These are currently focused on standards for x-ray analysis and also nanomechanics via atomic force microscopes and nanoindenters. Experimental research often relies critically on accurate analysis and characterization. These techniques require periodic calibration and frequent comparison with known standards. Existing standards are often extremely expensive, and many nanomechanics standards even change with time as they age. We seek to improve these standards and make them available more affordably.

More information on these activities will be coming soon. Please feel free to contact us if you're interested in what we've described, or if you have other suggestions. We'd love to hear from you!
nanoscience education, materials characterization services, x-ray analysis, AFM, materials analysis, scanning probe microscopy

Home || Industry Support || Research Support || Education Support || Contact
Atomic Force Microscopy || X-Ray Analysis || Scanning Electron Microscopy

Prairie Nanotechnology, 60 Hazelwood Drive, Champaign, IL 61820
Phone: 708-406-9608, Fax: 815-301-3851

Email us at:

This website and its contents © 2015 Prairie Nanotechnology, LLC. All Rights Reserved.